Reflectance Standards

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    Detailed Product Description:

    PN A338-MS-2Z Holder for Reflectance Standards

    Detailed Product Description:

    PN A338-MS-1 Specular Reflectance Standard, high reflectivity

    Detailed Product Description:

    Specular Reflectance Standard, high reflectivity, NIST-trace

    Detailed Product Description:

    Specular Reflectance Standard, low reflectivity

    Detailed Product Description:

    Diffuse Reflectance Standard, PTFE

    Detailed Product Description:

    Diffuse Reflectance Std, Spectralon

Ocean Insight offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin-film coatings. Add a STAN-HOLDER to keep your standards in place and to protect their coatings.

 

  • Convenient holder – optional accessory holds reflectance standards in place
  • Benefits -- keeps standard securely in place and helps preserve its coating

 

The STAN-SSH varies in reflectivity from 85%-98% over the 250-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2400 nm.

 

  • Specular reflectance – high specular reflectivity (85%-98% over the 250-2500 nm)
  • Calibrated standard – NIST-traceable version
  • Convenient holder – optional accessory holds standard in place

STAN-SSH

Engineering:

Reflectance Material:
Al mirror on fused silica substrate
Reflectivity:
“~85%-90% (250-800 nm) ~85%-98% (800-2500 nm) “
Spectral Range:
250-2000 nm
Dimensions (Housing):
38 mm OD x 19 mm height
Dimensions (Substrate):
31.75 mm OD x 6.35 mm height
Weight:
40 g

STAN-SSH-NIST

Engineering:

Reflectance Material:
Al mirror on fused silica substrate
Reflectivity:
“~85%-90% (250-800 nm) ~85%-98% (800-2400 nm)”
Spectral Range:
250-2400 nm
Dimensions (Housing):
38 mm OD x 19 mm height
Dimensions (Substrate):
31.75 mm OD x 6.35 mm height
Weight:
40 g

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